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The marriage of training and inference for scaled deep lear..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Gokmen, Tayfun ; Rasch, Malte J. ; Haensch, Wilfried - p. 22.3.1-22.3.4 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993573