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A Very Robust and Reliable 2.7GHz +31dBm Si RFSOI Transisto..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Garros, X. ; Cacho, F. ; Vincent, E.... - p. 25.5.1-25.5.4 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993649