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1 Ergebnisse
1
Application of Cell-Aware Test on an Advanced 3nm CMOS Tech..:
, In:
2019 IEEE International Test Conference (ITC)
,
Gao, Zhan
;
Malagi, Santosh
;
Hu, Min-Chun
... - p. 1-6 , 2019
Link:
https://doi.org/10.1109/ITC44170.2019.9000164
RT T1
2019 IEEE International Test Conference (ITC)
: T1
Application of Cell-Aware Test on an Advanced 3nm CMOS Technology Library
UL https://suche.suub.uni-bremen.de/peid=ieee-9000164&Exemplar=1&LAN=DE A1 Gao, Zhan A1 Malagi, Santosh A1 Hu, Min-Chun A1 Swenton, Joe A1 Baert, Rogier A1 Huisken, Jos A1 Chehab, Bilal A1 Goossen, Kees A1 Marinissen, Erik Jan YR 2019 SN 2378-2250 SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ITC44170.2019.9000164 DO https://doi.org/10.1109/ITC44170.2019.9000164 SF ELIB - SuUB Bremen
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