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1 Ergebnisse
1
Contact-to-Silicide Probing Attacks on Integrated Circuits ..:
, In:
2019 Asian Hardware Oriented Security and Trust Symposium (AsianHOST)
,
Covic, Ana
;
Shi, Qihang
;
Shen, Haoting
. - p. 1-6 , 2019
Link:
https://doi.org/10.1109/AsianHOST47458.2019.9006708
RT T1
2019 Asian Hardware Oriented Security and Trust Symposium (AsianHOST)
: T1
Contact-to-Silicide Probing Attacks on Integrated Circuits and Countermeasures
UL https://suche.suub.uni-bremen.de/peid=ieee-9006708&Exemplar=1&LAN=DE A1 Covic, Ana A1 Shi, Qihang A1 Shen, Haoting A1 Forte, Domenic YR 2019 K1 Integrated circuits K1 Metals K1 FinFETs K1 Substrates K1 Probes K1 Silicides K1 FIB K1 micro-probing K1 security SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/AsianHOST47458.2019.9006708 DO https://doi.org/10.1109/AsianHOST47458.2019.9006708 SF ELIB - SuUB Bremen
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