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Testing and diagnosis faults in FinFet circuits based on ad..:
, In:
2018 International Conference on Recent Innovations in Electrical, Electronics & Communication Engineering (ICRIEECE)
,
Rayudu, K.V.B.V.
;
Rao, P Srihari
;
Krishna Prasad, K S R
- p. 2782-2792 , 2018
Link:
https://doi.org/10.1109/ICRIEECE44171.2018.9009416
RT T1 <cTitle>2018 International Conference on Recent Innovations in Electrical, Electronics & Communication Engineering (ICRIEECE)</cTitle>: T1 <Title>Testing and diagnosis faults in FinFet circuits based on advanced test algorithm</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9009416&Exemplar=1&LAN=DE A1 Rayudu, K.V.B.V. A1 Rao, P Srihari A1 Krishna Prasad, K S R YR 2018 K1 Circuit faults K1 FinFETs K1 Delays K1 Integrated circuit modeling K1 Logic gates K1 Testing K1 Prediction algorithms K1 FinFET K1 Fault Analysis K1 Critical Path Delay K1 Non Incremental Computing Algorithm K1 Adaptive Genetic Algorithm SP 2782 OP 2792 LK http://dx.doi.org/https://doi.org/10.1109/ICRIEECE44171.2018.9009416 DO https://doi.org/10.1109/ICRIEECE44171.2018.9009416 SF ELIB - SuUB Bremen
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