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Optimization of Test Register Access Time for Next Generati..:

, In: 2018 3rd IEEE International Conference on Recent Trends in Electronics, Information & Communication Technology (RTEICT),
Inamdar, Akshatha P ; Shadab, Syed ; Ravish Aradhya, H.V. - p. 601-605 , 2018
Link: https://doi.org/10.1109/RTEICT42901.2018.9012237