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1 Ergebnisse
1
Fully Automated PCB testing and analysis of SIM Module for ..:
, In:
2018 3rd IEEE International Conference on Recent Trends in Electronics, Information & Communication Technology (RTEICT)
,
Ramaprasad, S S
;
Rajesh, G N
;
Sunil Kumar, K N
. - p. 2016-2020 , 2018
Link:
https://doi.org/10.1109/RTEICT42901.2018.9012443
RT T1 <cTitle>2018 3rd IEEE International Conference on Recent Trends in Electronics, Information & Communication Technology (RTEICT)</cTitle>: T1 <Title>Fully Automated PCB testing and analysis of SIM Module for Aircrafts</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9012443&Exemplar=1&LAN=DE A1 Ramaprasad, S S A1 Rajesh, G N A1 Sunil Kumar, K N A1 Rajendra Prasad, P YR 2018 K1 Testing K1 Pins K1 Aircraft K1 Visual BASIC K1 Voltage measurement K1 Circuit faults K1 Integrated circuits K1 PCB K1 LCA K1 LADC K1 Front End Design K1 Visual Basics K1 SIM module K1 ATE K1 DIM K1 JTAG K1 FATE K1 ICT K1 AOI SP 2016 OP 2020 LK http://dx.doi.org/https://doi.org/10.1109/RTEICT42901.2018.9012443 DO https://doi.org/10.1109/RTEICT42901.2018.9012443 SF ELIB - SuUB Bremen
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