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Evaluating the Drift-Region Length Effect of nLDMOS on ESD ..:

, In: 2019 IEEE 8th Global Conference on Consumer Electronics (GCCE),
Lin, Po-Lin ; Chen, Shen-Li ; Wu, Pei-Lin.. - p. 83-84 , 2019
Link: https://doi.org/10.1109/GCCE46687.2019.9015277