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1
Contact Device with Tunable Strip Matching Circuits for Mea..:
, In:
2019 PhotonIcs & Electromagnetics Research Symposium - Spring (PIERS-Spring)
,
Evseev, V. I.
;
Lupanova, E. A.
;
Nikulin, S. M.
. - p. 2752-2755 , 2019
Link:
https://doi.org/10.1109/PIERS-Spring46901.2019.9017801
RT T1 <cTitle>2019 PhotonIcs & Electromagnetics Research Symposium - Spring (PIERS-Spring)</cTitle>: T1 <Title>Contact Device with Tunable Strip Matching Circuits for Measuring Parameters of Microwave Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9017801&Exemplar=1&LAN=DE A1 Evseev, V. I. A1 Lupanova, E. A. A1 Nikulin, S. M. A1 Petrov, V. V. YR 2019 SN 1559-9450 K1 Transistors K1 Transmission line measurements K1 Scattering parameters K1 Microwave circuits K1 Microwave transistors K1 Frequency measurement SP 2752 OP 2755 LK http://dx.doi.org/https://doi.org/10.1109/PIERS-Spring46901.2019.9017801 DO https://doi.org/10.1109/PIERS-Spring46901.2019.9017801 SF ELIB - SuUB Bremen
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