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1 Ergebnisse
1
An Integrated Method of HALT-HASS-ADT for Space Electronic ..:
, In:
2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE)
,
Liu, Kai
;
Lv, Cong-Min
;
Dang, Wei
... - p. 322-327 , 2019
Link:
https://doi.org/10.1109/QR2MSE46217.2019.9021146
RT T1 <cTitle>2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE)</cTitle>: T1 <Title>An Integrated Method of HALT-HASS-ADT for Space Electronic Products</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9021146&Exemplar=1&LAN=DE A1 Liu, Kai A1 Lv, Cong-Min A1 Dang, Wei A1 Li, Peng A1 Zou, Tian-Ji A1 Xin, Min-Cheng YR 2019 K1 Degradation K1 Stress K1 Reliability K1 Data models K1 Temperature distribution K1 Life estimation K1 Acceleration K1 space electronic products K1 highly accelerated life testing K1 highly accelerated stress screening K1 accelerated degradation testing K1 solid state drive SP 322 OP 327 LK http://dx.doi.org/https://doi.org/10.1109/QR2MSE46217.2019.9021146 DO https://doi.org/10.1109/QR2MSE46217.2019.9021146 SF ELIB - SuUB Bremen
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