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Enhancing the data analysis in IC testing by machine learni..:

, In: 2019 14th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT),
Tsai, Tsung-Han ; Lee, Yu-Chen ; Hsieh, Chi-Yu - p. 183-186 , 2019
Link: https://doi.org/10.1109/IMPACT47228.2019.9024981