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Iterative Delayering and Electrical Fault Isolation for Def..:

, In: 2019 IEEE 21st Electronics Packaging Technology Conference (EPTC),
Siang, Tan Hong ; Bernice, Zee ; Jie, Foo Fang - p. 189-191 , 2019
Link: https://doi.org/10.1109/EPTC47984.2019.9026579