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1 Ergebnisse
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Failure detection technique for 2/2um RDL on FOPLP:
, In:
2019 IEEE 21st Electronics Packaging Technology Conference (EPTC)
,
Gunji, Keita
;
Takagi, Noriaki
;
Hibarino, Toshibisa
- p. 184-188 , 2019
Link:
https://doi.org/10.1109/EPTC47984.2019.9026657
RT T1 <cTitle>2019 IEEE 21st Electronics Packaging Technology Conference (EPTC)</cTitle>: T1 <Title>Failure detection technique for 2/2um RDL on FOPLP</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9026657&Exemplar=1&LAN=DE A1 Gunji, Keita A1 Takagi, Noriaki A1 Hibarino, Toshibisa YR 2019 K1 Capacitance K1 Inspection K1 Wiring K1 Capacitance measurement K1 Plating K1 Probes K1 Reliability SP 184 OP 188 LK http://dx.doi.org/https://doi.org/10.1109/EPTC47984.2019.9026657 DO https://doi.org/10.1109/EPTC47984.2019.9026657 SF ELIB - SuUB Bremen
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