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Experimental and TCAD Study of Breakdown Voltage Enhancemen..:
, In:
2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus)
,
Amelin, Yury V.
;
Krasukov, Anton Y.
;
Artamonova, Evgeniya A.
- p. 1760-1766 , 2020
Link:
https://doi.org/10.1109/EIConRus49466.2020.9039032
RT T1 <cTitle>2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus)</cTitle>: T1 <Title>Experimental and TCAD Study of Breakdown Voltage Enhancement of high-voltage MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9039032&Exemplar=1&LAN=DE A1 Amelin, Yury V. A1 Krasukov, Anton Y. A1 Artamonova, Evgeniya A. YR 2020 SN 2376-6565 K1 high-voltage K1 planar K1 breakdown K1 MOSFET K1 TCAD K1 device simulation SP 1760 OP 1766 LK http://dx.doi.org/https://doi.org/10.1109/EIConRus49466.2020.9039032 DO https://doi.org/10.1109/EIConRus49466.2020.9039032 SF ELIB - SuUB Bremen
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