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1 Ergebnisse
1
External Bit Interleaving for Commercial SRAM:
, In:
2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus)
,
Fateev, Ivan
;
Chaplygin, Yury A.
- p. 1795-1798 , 2020
Link:
https://doi.org/10.1109/EIConRus49466.2020.9039165
RT T1 <cTitle>2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus)</cTitle>: T1 <Title>External Bit Interleaving for Commercial SRAM</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9039165&Exemplar=1&LAN=DE A1 Fateev, Ivan A1 Chaplygin, Yury A. YR 2020 SN 2376-6565 K1 Random access memory K1 Ions K1 Memory modules K1 Robustness K1 Decoding K1 Memory management K1 Multiple cells upset K1 Multiple bits upset K1 single event effects K1 memory interleaving SP 1795 OP 1798 LK http://dx.doi.org/https://doi.org/10.1109/EIConRus49466.2020.9039165 DO https://doi.org/10.1109/EIConRus49466.2020.9039165 SF ELIB - SuUB Bremen
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