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1 Ergebnisse
1
Mechanical Stresses Analysis of Thin Round Membranes in the..:
, In:
2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus)
,
Dedkova, Anna A.
;
Yu. Glagolev, Petr
;
Demin, Gleb D.
.. - p. 2288-2292 , 2020
Link:
https://doi.org/10.1109/EIConRus49466.2020.9039289
RT T1 <cTitle>2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus)</cTitle>: T1 <Title>Mechanical Stresses Analysis of Thin Round Membranes in the Case of Large Deflections</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9039289&Exemplar=1&LAN=DE A1 Dedkova, Anna A. A1 Yu. Glagolev, Petr A1 Demin, Gleb D. A1 Gusev, Evgeney E. A1 Skvortsov, Pavel A. YR 2020 SN 2376-6565 K1 Stress K1 Finite element analysis K1 Software packages K1 Strain K1 Young's modulus K1 mechanical strength K1 mechanical stress K1 membrane K1 MEMS K1 thin film K1 von Mises stress K1 finite-element numerical calculations SP 2288 OP 2292 LK http://dx.doi.org/https://doi.org/10.1109/EIConRus49466.2020.9039289 DO https://doi.org/10.1109/EIConRus49466.2020.9039289 SF ELIB - SuUB Bremen
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