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1 Ergebnisse
1
High-Impedance, Broadband and Compact RMS Detectors for On-..:
, In:
2020 IEEE 20th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)
,
Kshattry, S.
;
Yu, C.-K.
;
Wu, C.-L.
... - p. 22-25 , 2020
Link:
https://doi.org/10.1109/SIRF46766.2020.9040184
RT T1
2020 IEEE 20th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)
: T1
High-Impedance, Broadband and Compact RMS Detectors for On-Chip Measurements of Millimeter Wave Voltages for Built-In Self-Testing and Debugging
UL https://suche.suub.uni-bremen.de/peid=ieee-9040184&Exemplar=1&LAN=DE A1 Kshattry, S. A1 Yu, C.-K. A1 Wu, C.-L. A1 Yun, Y. A1 Lee, C. A1 Cha, C.-Y. A1 Choi, W.-Y. A1 Preisler, N. A1 O, K. K. YR 2020 SN 2474-9761 K1 Detectors K1 Voltage measurement K1 Schottky diodes K1 Millimeter wave measurements K1 Frequency measurement K1 Millimeter wave circuits K1 millimeter wave K1 root mean square detector K1 built-in self-test K1 self-healing K1 debugging K1 CMOS SP 22 OP 25 LK http://dx.doi.org/https://doi.org/10.1109/SIRF46766.2020.9040184 DO https://doi.org/10.1109/SIRF46766.2020.9040184 SF ELIB - SuUB Bremen
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