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1 Ergebnisse
1
Improved Resistive Switching Behavior in Solution-processed..:
, In:
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
,
Qi, Y F
;
Zhao, C Z
;
Zhao, C
... - p. 1-4 , 2019
Link:
https://doi.org/10.1109/EUROSOI-ULIS45800.2019.9041862
RT T1 <cTitle>2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)</cTitle>: T1 <Title>Improved Resistive Switching Behavior in Solution-processed AlOx based RRAM</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9041862&Exemplar=1&LAN=DE A1 Qi, Y F A1 Zhao, C Z A1 Zhao, C A1 Mitrovic, I Z A1 Xu, W Y A1 Yang, L A1 Shen, Z J A1 He, J H YR 2019 SN 2472-9132 K1 RRAM K1 Resistive Switching K1 Aluminum Oxide K1 Solution-processed K1 ALD SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/EUROSOI-ULIS45800.2019.9041862 DO https://doi.org/10.1109/EUROSOI-ULIS45800.2019.9041862 SF ELIB - SuUB Bremen
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