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1 Ergebnisse
1
Back-bias impact on variability and BTI for 3D-monolithic 1..:
, In:
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
,
Bosch, D.
;
Andrieu, F.
;
Garros, X.
... - p. 1-4 , 2019
Link:
https://doi.org/10.1109/EUROSOI-ULIS45800.2019.9041890
RT T1 <cTitle>2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)</cTitle>: T1 <Title>Back-bias impact on variability and BTI for 3D-monolithic 14nm FDSOI SRAMs applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9041890&Exemplar=1&LAN=DE A1 Bosch, D. A1 Andrieu, F. A1 Garros, X. A1 Ciampolini, L. A1 Makosiej, A. A1 Weber, O. A1 Lacord, J. A1 Cluzel, J. A1 Giraud, B. A1 Cibrario, G. A1 Brunet, L. A1 Batude, P. A1 Fenouillet-Beranger, C. A1 Lattard, D. A1 Colinge, J. P. A1 Balestra, F. A1 Vinet, M. YR 2019 SN 2472-9132 K1 3D-monolithic K1 FDSOI K1 BTI stress K1 Supply Read Retention Voltage K1 SRAM margins K1 SNM K1 WNM K1 variability K1 Back/Body Biasing SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/EUROSOI-ULIS45800.2019.9041890 DO https://doi.org/10.1109/EUROSOI-ULIS45800.2019.9041890 SF ELIB - SuUB Bremen
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