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Low frequency noise analysis on Si/SiGe superlattice I/O n-..:
, In:
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
,
Boudier, D.
;
Cretu, B.
;
Simoen, E.
... - p. 1-4 , 2019
Link:
https://doi.org/10.1109/EUROSOI-ULIS45800.2019.9041918
RT T1
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
: T1
Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs
UL https://suche.suub.uni-bremen.de/peid=ieee-9041918&Exemplar=1&LAN=DE A1 Boudier, D. A1 Cretu, B. A1 Simoen, E. A1 Hellings, G. A1 Schram, T. A1 Mertens, H. A1 Linten, D. YR 2019 SN 2472-9132 K1 Logic gates K1 FinFETs K1 1/f noise K1 Superlattices K1 Low-frequency noise K1 Temperature K1 Spectroscopy K1 Si/SiGe superlattice Fin FET K1 low frequency noise K1 flicker noise K1 generation-recombination noise SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/EUROSOI-ULIS45800.2019.9041918 DO https://doi.org/10.1109/EUROSOI-ULIS45800.2019.9041918 SF ELIB - SuUB Bremen
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