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1 Ergebnisse
1
Fabrication of Al-Based Superconducting High-Aspect Ratio T..:
, In:
2020 IEEE 33rd International Conference on Micro Electro Mechanical Systems (MEMS)
,
Alfaro-Barrantes, Juan A.
;
Mastrangeli, Massimo
;
Thoen, David J.
... - p. 932-935 , 2020
Link:
https://doi.org/10.1109/MEMS46641.2020.9056165
RT T1
2020 IEEE 33rd International Conference on Micro Electro Mechanical Systems (MEMS)
: T1
Fabrication of Al-Based Superconducting High-Aspect Ratio TSVS for Quantum 3D Integration
UL https://suche.suub.uni-bremen.de/peid=ieee-9056165&Exemplar=1&LAN=DE A1 Alfaro-Barrantes, Juan A. A1 Mastrangeli, Massimo A1 Thoen, David J. A1 Bueno, Juan A1 Baselmans, Jochem J. A. A1 Sarro, Pasqualina M. YR 2020 SN 2160-1968 K1 Through-silicon vias K1 superconducting K1 quantum SP 932 OP 935 LK http://dx.doi.org/https://doi.org/10.1109/MEMS46641.2020.9056165 DO https://doi.org/10.1109/MEMS46641.2020.9056165 SF ELIB - SuUB Bremen
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