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Carbon Black Nanoparticles Inclusion in Bismuth Telluride F..:

, In: 2020 IEEE 33rd International Conference on Micro Electro Mechanical Systems (MEMS),
Samat, Khairul Fadzli ; Li, Yijie ; van Toan, Nguyen. - p. 562-565 , 2020
Link: https://doi.org/10.1109/MEMS46641.2020.9056323