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Impact of X-Ray Radiation on GaN/AlN MEMS Structure and GaN..:
, In:
2020 IEEE 33rd International Conference on Micro Electro Mechanical Systems (MEMS)
,
Lin, Ji-Tzuoh
;
Wang, Peng
;
Shuvra, Pranoy
... - p. 968-971 , 2020
Link:
https://doi.org/10.1109/MEMS46641.2020.9056389
RT T1
2020 IEEE 33rd International Conference on Micro Electro Mechanical Systems (MEMS)
: T1
Impact of X-Ray Radiation on GaN/AlN MEMS Structure and GaN HEMT Gauge Factor Response
UL https://suche.suub.uni-bremen.de/peid=ieee-9056389&Exemplar=1&LAN=DE A1 Lin, Ji-Tzuoh A1 Wang, Peng A1 Shuvra, Pranoy A1 McNamara, Shamus A1 McCurdy, Mike A1 Davidson, Jim A1 Walsh, Kevin A1 Alles, Mike A1 Alphenaar, Bruce YR 2020 SN 2160-1968 K1 GaN/AlN beams K1 GaN HEMT K1 Gauge factor K1 piezoresistivity K1 piezoelectricity K1 X-ray radiation SP 968 OP 971 LK http://dx.doi.org/https://doi.org/10.1109/MEMS46641.2020.9056389 DO https://doi.org/10.1109/MEMS46641.2020.9056389 SF ELIB - SuUB Bremen
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