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A Maximum-Eye-Tracking CDR with Biased Data-Level and Eye S..:

, In: 2019 IEEE Asian Solid-State Circuits Conference (A-SSCC),
Joo, Hye-Yoon ; Jeong, Deog-Kyoon - p. 243-244 , 2019
Link: https://doi.org/10.1109/A-SSCC47793.2019.9056953