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1 Ergebnisse
1
A Cost Effective Test Screening Circuit for embedded SRAM w..:
, In:
2019 IEEE Asian Solid-State Circuits Conference (A-SSCC)
,
Yokoyama, Yoshisato
;
Goto, Kenji
;
Miura, Tomohiro
... - p. 17-20 , 2019
Link:
https://doi.org/10.1109/A-SSCC47793.2019.9056978
RT T1
2019 IEEE Asian Solid-State Circuits Conference (A-SSCC)
: T1
A Cost Effective Test Screening Circuit for embedded SRAM with Resume Standby on 110-nm SoC/MCU
UL https://suche.suub.uni-bremen.de/peid=ieee-9056978&Exemplar=1&LAN=DE A1 Yokoyama, Yoshisato A1 Goto, Kenji A1 Miura, Tomohiro A1 Ouchi, Yukari A1 Nakamura, Daisuke A1 Ishikawa, Jiro A1 Nagata, Shunya A1 Tsujihashi, Yoshiki A1 Ishii, Yuichiro YR 2019 K1 SRAM K1 Low standby power K1 Data retention K1 Testing cost K1 Resume standby K1 IoT SP 17 OP 20 LK http://dx.doi.org/https://doi.org/10.1109/A-SSCC47793.2019.9056978 DO https://doi.org/10.1109/A-SSCC47793.2019.9056978 SF ELIB - SuUB Bremen
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