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Multi-layer Joint Classification-Metric Deep Learning for T..:

, In: 2019 IEEE 2nd International Conference on Electronics and Communication Engineering (ICECE),
Jiao, Shanshan ; Wang, Jiabao ; Pan, Zhisong... - p. 47-50 , 2019
Link: https://doi.org/10.1109/ICECE48499.2019.9058499