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1 Ergebnisse
1
Anaylysis of Mechanism About Data Retention Characteristic ..:
, In:
2020 Pan Pacific Microelectronics Symposium (Pan Pacific)
,
Lee, Ji-Seok
;
Yun, Ilgu
- p. 1-8 , 2020
Link:
https://doi.org/10.23919/PanPacific48324.2020.9059496
RT T1 <cTitle>2020 Pan Pacific Microelectronics Symposium (Pan Pacific)</cTitle>: T1 <Title>Anaylysis of Mechanism About Data Retention Characteristic in Tanos Structure</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9059496&Exemplar=1&LAN=DE A1 Lee, Ji-Seok A1 Yun, Ilgu YR 2020 K1 Electron traps K1 Tunneling K1 Data models K1 Mathematical model K1 Dielectrics K1 Analytical models K1 Electric fields K1 NAND K1 TANOS K1 CTF K1 Data Retention K1 Reliability K1 Compact modeling K1 TCAD Simulation SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.23919/PanPacific48324.2020.9059496 DO https://doi.org/10.23919/PanPacific48324.2020.9059496 SF ELIB - SuUB Bremen
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