I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Present Status of the Dual-Sided Microstructured Semiconduc..:
, In:
2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
,
Ochs, Taylor R.
;
Terrell, Jacob M.
;
Hutchins, Robyn M.
... - p. 1-5 , 2019
Link:
https://doi.org/10.1109/NSS/MIC42101.2019.9059658
RT T1
2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
: T1
Present Status of the Dual-Sided Microstructured Semiconductor Neutron Detector (DS-MSND) and Instrumentation
UL https://suche.suub.uni-bremen.de/peid=ieee-9059658&Exemplar=1&LAN=DE A1 Ochs, Taylor R. A1 Terrell, Jacob M. A1 Hutchins, Robyn M. A1 Scott DeMint, K. A1 Bellinger, Steven L. A1 Henson, Luke C. A1 McGregor, Douglas S. YR 2019 SN 2577-0829 K1 Gamma-rays K1 Detectors K1 Neutrons K1 Silicon K1 Electric fields K1 Semiconductor process modeling K1 Doping profiles SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/NSS/MIC42101.2019.9059658 DO https://doi.org/10.1109/NSS/MIC42101.2019.9059658 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)