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1 Ergebnisse
1
Performance of silicon sensor quality control centre develo..:
, In:
2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
,
Jain, C.
;
Saumya
;
Abhijeet
... - p. 1-4 , 2019
Link:
https://doi.org/10.1109/NSS/MIC42101.2019.9059697
RT T1 <cTitle>2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)</cTitle>: T1 <Title>Performance of silicon sensor quality control centre developed at the University of Delhi</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9059697&Exemplar=1&LAN=DE A1 Jain, C. A1 Saumya A1 Abhijeet A1 Sondh, S. A1 Kumar, A. A1 Jain, G. A1 Bhardwaj, A. A1 Ranjan, K. A1 Messineo, A. A1 Ciocci, M. A. A1 Grippo, M. T. A1 Parolia, S. A1 Androsov, K. YR 2019 SN 2577-0829 K1 Strips K1 Semiconductor device measurement K1 Temperature measurement K1 Current measurement K1 Silicon K1 Voltage measurement K1 Physics K1 Characterization set up K1 silicon sensors K1 HL-LHC K1 Phase 2 upgrade K1 quality control centre SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/NSS/MIC42101.2019.9059697 DO https://doi.org/10.1109/NSS/MIC42101.2019.9059697 SF ELIB - SuUB Bremen
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