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1 Ergebnisse
1
15.2 A 28nm 64Kb Inference-Training Two-Way Transpose Multi..:
, In:
2020 IEEE International Solid- State Circuits Conference - (ISSCC)
,
Su, Jian-Wei
;
Si, Xin
;
Chou, Yen-Chi
... - p. 240-242 , 2020
Link:
https://doi.org/10.1109/ISSCC19947.2020.9062949
RT T1
2020 IEEE International Solid- State Circuits Conference - (ISSCC)
: T1
15.2 A 28nm 64Kb Inference-Training Two-Way Transpose Multibit 6T SRAM Compute-in-Memory Macro for AI Edge Chips
UL https://suche.suub.uni-bremen.de/peid=ieee-9062949&Exemplar=1&LAN=DE A1 Su, Jian-Wei A1 Si, Xin A1 Chou, Yen-Chi A1 Chang, Ting-Wei A1 Huang, Wei-Hsing A1 Tu, Yung-Ning A1 Liu, Ruhui A1 Lu, Pei-Jung A1 Liu, Ta-Wei A1 Wang, Jing-Hong A1 Zhang, Zhixiao A1 Jiang, Hongwu A1 Huang, Shanshi A1 Lo, Chung-Chuan A1 Liu, Ren-Shuo A1 Hsieh, Chih-Cheng A1 Tang, Kea-Tiong A1 Sheu, Shyh-Shyuan A1 Li, Sih-Han A1 Lee, Heng-Yuan A1 Chang, Shih-Chieh A1 Yu, Shimeng A1 Chang, Meng-Fan YR 2020 SN 2376-8606 K1 Training K1 Threshold voltage K1 Machine learning K1 Common Information Model (computing) K1 SRAM cells SP 240 OP 242 LK http://dx.doi.org/https://doi.org/10.1109/ISSCC19947.2020.9062949 DO https://doi.org/10.1109/ISSCC19947.2020.9062949 SF ELIB - SuUB Bremen
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