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1 Ergebnisse
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5.8 A 0.50e-rmsNoise 1.45µm-Pitch CMOS Image Sensor with Re..:
, In:
2020 IEEE International Solid- State Circuits Conference - (ISSCC)
,
Sato, Mamoru
;
Yorikado, Yuhi
;
Matsumura, Yusuke
... - p. 108-110 , 2020
Link:
https://doi.org/10.1109/ISSCC19947.2020.9063017
RT T1
2020 IEEE International Solid- State Circuits Conference - (ISSCC)
: T1
5.8 A 0.50e-rmsNoise 1.45µm-Pitch CMOS Image Sensor with Reference-Shared In-Pixel Differential Amplifier at 8.3Mpixel 35fps
UL https://suche.suub.uni-bremen.de/peid=ieee-9063017&Exemplar=1&LAN=DE A1 Sato, Mamoru A1 Yorikado, Yuhi A1 Matsumura, Yusuke A1 Naganuma, Hideki A1 Kato, Eriko A1 Toyofuku, Takuya A1 Kato, Akihiko A1 Oike, Yusuke YR 2020 SN 2376-8606 K1 Transistors K1 CMOS image sensors K1 Sensors K1 Capacitance K1 Switching circuits K1 Noise measurement SP 108 OP 110 LK http://dx.doi.org/https://doi.org/10.1109/ISSCC19947.2020.9063017 DO https://doi.org/10.1109/ISSCC19947.2020.9063017 SF ELIB - SuUB Bremen
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