I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
5.7 A 132dB Single-Exposure-Dynamic-Range CMOS Image Sensor..:
, In:
2020 IEEE International Solid- State Circuits Conference - (ISSCC)
,
Sakano, Yorito
;
Toyoshima, Takahiro
;
Nakamura, Ryosuke
... - p. 106-108 , 2020
Link:
https://doi.org/10.1109/ISSCC19947.2020.9063095
RT T1 <cTitle>2020 IEEE International Solid- State Circuits Conference - (ISSCC)</cTitle>: T1 <Title>5.7 A 132dB Single-Exposure-Dynamic-Range CMOS Image Sensor with High Temperature Tolerance</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9063095&Exemplar=1&LAN=DE A1 Sakano, Yorito A1 Toyoshima, Takahiro A1 Nakamura, Ryosuke A1 Asatsuma, Tomohiko A1 Hattori, Yuki A1 Yamanaka, Takayuki A1 Yoshikawa, Ryoichi A1 Kawazu, Naoki A1 Matsuura, Tomohiro A1 Iinuma, Takahiro A1 Toya, Takahiro A1 Watanabe, Tomohiko A1 Suzuki, Atsushi A1 Motohashi, Yuichi A1 Azami, Junichiro A1 Tateshita, Yasushi A1 Haruta, Tsutomu YR 2020 SN 2376-8606 K1 Switches K1 Capacitors K1 Transistors K1 Signal to noise ratio K1 Conferences K1 CMOS image sensors SP 106 OP 108 LK http://dx.doi.org/https://doi.org/10.1109/ISSCC19947.2020.9063095 DO https://doi.org/10.1109/ISSCC19947.2020.9063095 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
