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Silicon Wafer Map Defect Classification Using Deep Convolut..:

, In: 2019 IEEE 5th International Conference on Computer and Communications (ICCC),
Shawon, Ashadullah ; Faruk, Md Omar ; Habib, Masrur Bin. - p. 1995-1999 , 2019
Link: https://doi.org/10.1109/ICCC47050.2019.9064029