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Prediction of Defects Occurrence Time for Capacitive Device:
, In:
2019 16th International Computer Conference on Wavelet Active Media Technology and Information Processing
,
Peng, Jing
;
Zhou, Fang-rong
;
Xiang, Hao-ran
... - p. 226-229 , 2019
Link:
https://doi.org/10.1109/ICCWAMTIP47768.2019.9067704
RT T1 <cTitle>2019 16th International Computer Conference on Wavelet Active Media Technology and Information Processing</cTitle>: T1 <Title>Prediction of Defects Occurrence Time for Capacitive Device</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9067704&Exemplar=1&LAN=DE A1 Peng, Jing A1 Zhou, Fang-rong A1 Xiang, Hao-ran A1 Ma, Yi A1 Zheng, Ze-zhong A1 Jiang, Shao-bing A1 Li, Jiang YR 2019 SN 2576-8964 K1 Predictive models K1 Radio frequency K1 Training K1 Feature extraction K1 Dimensionality reduction K1 Noise reduction K1 Regression tree analysis K1 Prediction of defects occurrence time K1 Capacitive devices K1 Sparse auto encoder K1 Gradient boosting decision tree SP 226 OP 229 LK http://dx.doi.org/https://doi.org/10.1109/ICCWAMTIP47768.2019.9067704 DO https://doi.org/10.1109/ICCWAMTIP47768.2019.9067704 SF ELIB - SuUB Bremen
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