I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Convolutional Neural Network for Imbalanced Data Classifica..:
, In:
2020 16th IEEE International Colloquium on Signal Processing & Its Applications (CSPA)
,
Batool, Uzma
;
Shapiai, Mohd Ibrahim
;
Fauzi, Hilman
. - p. 230-235 , 2020
Link:
https://doi.org/10.1109/CSPA48992.2020.9068669
RT T1 <cTitle>2020 16th IEEE International Colloquium on Signal Processing & Its Applications (CSPA)</cTitle>: T1 <Title>Convolutional Neural Network for Imbalanced Data Classification of Silicon Wafer Defects</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9068669&Exemplar=1&LAN=DE A1 Batool, Uzma A1 Shapiai, Mohd Ibrahim A1 Fauzi, Hilman A1 Fong, Jia Xian YR 2020 K1 Feature extraction K1 Silicon K1 Machine learning K1 Semiconductor device modeling K1 Training K1 Convolution K1 Pattern recognition K1 class imbalance K1 convolutional neural network K1 imbalance data K1 under-sampling K1 wafer defect classification SP 230 OP 235 LK http://dx.doi.org/https://doi.org/10.1109/CSPA48992.2020.9068669 DO https://doi.org/10.1109/CSPA48992.2020.9068669 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
