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1 Ergebnisse
1
Reliability Evaluation of Compressed Deep Learning Models:
, In:
2020 IEEE 11th Latin American Symposium on Circuits & Systems (LASCAS)
,
Goldstein, Brunno F.
;
Srinivasan, Sudarshan
;
Das, Dipankar
... - p. 1-5 , 2020
Link:
https://doi.org/10.1109/LASCAS45839.2020.9069026
RT T1
2020 IEEE 11th Latin American Symposium on Circuits & Systems (LASCAS)
: T1
Reliability Evaluation of Compressed Deep Learning Models
UL https://suche.suub.uni-bremen.de/peid=ieee-9069026&Exemplar=1&LAN=DE A1 Goldstein, Brunno F. A1 Srinivasan, Sudarshan A1 Das, Dipankar A1 Banerjee, Kunal A1 Santiago, Leandro A1 Ferreira, Victor C. A1 Nery, Alexandre S. A1 Kundu, Sandip A1 Franca, Felipe M. G. YR 2020 SN 2473-4667 K1 Quantization (signal) K1 Computational modeling K1 Reliability K1 Data models K1 Neural networks K1 Mathematical model K1 Machine learning K1 Resilience K1 Soft Error K1 Transient Fault K1 Neural Network K1 Deep Learning SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/LASCAS45839.2020.9069026 DO https://doi.org/10.1109/LASCAS45839.2020.9069026 SF ELIB - SuUB Bremen
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