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Electrical and Thermal Characterization for SOI p-type FinF..:

, In: 2020 IEEE Latin America Electron Devices Conference (LAEDC),
Lopez-L., Omar ; Martinez, I ; Gutierrez-D, E.A.... - p. 1-3 , 2020
Link: https://doi.org/10.1109/LAEDC49063.2020.9072950