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Automatic Detection and Correction of Blink Artifacts in Si..:

, In: 2020 International Conference on Artificial Intelligence and Signal Processing (AISP),
Goru, Hema Kumar ; Anumala, Vijayasankar ; PV, Subbaiah. - p. 1-5 , 2020
Link: https://doi.org/10.1109/AISP48273.2020.9073123