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1
Comprehensive Pulse Shape Induced Failure Analysis in Volta..:
, In:
2019 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH)
,
Liu, Mingyue
;
Cai, Hao
;
Han, Menglin
... - p. 1-6 , 2019
Link:
https://doi.org/10.1109/NANOARCH47378.2019.181292
RT T1 <cTitle>2019 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH)</cTitle>: T1 <Title>Comprehensive Pulse Shape Induced Failure Analysis in Voltage-Controlled MRAM</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9073202&Exemplar=1&LAN=DE A1 Liu, Mingyue A1 Cai, Hao A1 Han, Menglin A1 Xie, Lei A1 Yang, Jun A1 Naviner, Lirida YR 2019 SN 2327-8226 K1 Magnetic tunneling K1 Switches K1 Thermal stability K1 Writing K1 Shape K1 Magnetic anisotropy K1 Error analysis K1 VCMA K1 Reliability K1 Reverse voltage K1 Pulse shape K1 write failure SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/NANOARCH47378.2019.181292 DO https://doi.org/10.1109/NANOARCH47378.2019.181292 SF ELIB - SuUB Bremen
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