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1 Ergebnisse
1
A method to model Vccinfeedthrough Noise in Microprocessors..:
, In:
2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)
,
Govindan, Srinivasan
;
Bharath, Krishna
;
Gope, Dipanjan
.. - p. 1-3 , 2019
Link:
https://doi.org/10.1109/EPEPS47316.2019.193202
RT T1
2019 IEEE 28th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)
: T1
A method to model Vccinfeedthrough Noise in Microprocessors with Fully Integrated Voltage Regulators - Distributed Formulation
UL https://suche.suub.uni-bremen.de/peid=ieee-9073273&Exemplar=1&LAN=DE A1 Govindan, Srinivasan A1 Bharath, Krishna A1 Gope, Dipanjan A1 Venkataraman, Srikrishnan A1 Ambasana, Nikita YR 2019 SN 2165-4115 K1 Inductors K1 Voltage control K1 Matrices K1 System-on-chip K1 Capacitors K1 Regulators K1 Load modeling K1 Electronic packages and microsystems K1 Electromagnetic (EM) and EM interference modeling K1 simulation algorithms K1 tools K1 and flows K1 Power integrity and power distribution networks SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EPEPS47316.2019.193202 DO https://doi.org/10.1109/EPEPS47316.2019.193202 SF ELIB - SuUB Bremen
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