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1 Ergebnisse
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Electrical characterization of advanced MOSFETs towards ana..:
, In:
2020 IEEE Latin America Electron Devices Conference (LAEDC)
,
Kilchytska, Valeriya
;
Makovejev, Sergej
;
Esfeh, Babak Kazemi
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/LAEDC49063.2020.9073536
RT T1
2020 IEEE Latin America Electron Devices Conference (LAEDC)
: T1
Electrical characterization of advanced MOSFETs towards analog and RF applications
UL https://suche.suub.uni-bremen.de/peid=ieee-9073536&Exemplar=1&LAN=DE A1 Kilchytska, Valeriya A1 Makovejev, Sergej A1 Esfeh, Babak Kazemi A1 Nyssens, Lucas A1 Halder, Arka A1 Raskin, Jean-Pierre A1 Flandre, Denis YR 2020 K1 FinFETs K1 Performance evaluation K1 Radio frequency K1 Logic gates K1 Silicon-on-insulator K1 UTBB K1 FDSOI K1 FinFET K1 MOSFET K1 Self-heating K1 S-parameters K1 Analog and RF figures of merit SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/LAEDC49063.2020.9073536 DO https://doi.org/10.1109/LAEDC49063.2020.9073536 SF ELIB - SuUB Bremen
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