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Process Variation-Resilient STT-MTJ based TRNG using Linear..:

, In: 2019 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH),
Ali, Rashid ; Wang, You ; Hou, Zhengyi... - p. 1-6 , 2019
Link: https://doi.org/10.1109/NANOARCH47378.2019.181294