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High-resolution roughness measurements using cold atom refl..:

, In: Conference Digest. 2000 International Quantum Electronics Conference (Cat. No.00TH8504),
Savalli, V. ; Featonby, P.D. ; Josse, V.... - p. 1 pp. , 2000
Link: https://doi.org/10.1109/IQEC.2000.908139