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The Hierarchy of a Generalized Automatic Test System for El..:

, In: 2020 IEEE 4th Information Technology, Networking, Electronic and Automation Control Conference (ITNEC),
Yan, Li ; Long, Cheng ; Weiqi, Xie. - p. 1-5 , 2020
Link: https://doi.org/10.1109/ITNEC48623.2020.9084848