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1 Ergebnisse
1
The Hierarchy of a Generalized Automatic Test System for El..:
, In:
2020 IEEE 4th Information Technology, Networking, Electronic and Automation Control Conference (ITNEC)
,
Yan, Li
;
Long, Cheng
;
Weiqi, Xie
. - p. 1-5 , 2020
Link:
https://doi.org/10.1109/ITNEC48623.2020.9084848
RT T1
2020 IEEE 4th Information Technology, Networking, Electronic and Automation Control Conference (ITNEC)
: T1
The Hierarchy of a Generalized Automatic Test System for Electrical Signals
UL https://suche.suub.uni-bremen.de/peid=ieee-9084848&Exemplar=1&LAN=DE A1 Yan, Li A1 Long, Cheng A1 Weiqi, Xie A1 Jianhua, Wang YR 2020 K1 Hardware K1 Analytical models K1 Data models K1 Calibration K1 Software K1 Process control K1 Distributed databases K1 generalization K1 test system K1 hierarchy K1 structure K1 data bus SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ITNEC48623.2020.9084848 DO https://doi.org/10.1109/ITNEC48623.2020.9084848 SF ELIB - SuUB Bremen
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