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1 Ergebnisse
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Determination of Bi12SiO20 permittivity and loss tangent in..:
, In:
2020 IEEE 15th International Conference on Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering (TCSET)
,
Bajurko, Pawel
;
Godziszewski, Konrad
;
Yashchyshyn, Yevhen
... - p. 576-579 , 2020
Link:
https://doi.org/10.1109/TCSET49122.2020.235498
RT T1 <cTitle>2020 IEEE 15th International Conference on Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering (TCSET)</cTitle>: T1 <Title>Determination of Bi12SiO20 permittivity and loss tangent in the 220–325 GHz band and the influence of UV exposure on these parameters</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9088668&Exemplar=1&LAN=DE A1 Bajurko, Pawel A1 Godziszewski, Konrad A1 Yashchyshyn, Yevhen A1 Vynnyk, Dmytro A1 Haiduchok, Volodymyr A1 Solskii, Ivan YR 2020 K1 sillenites K1 subterahertz frequencies K1 material characterization K1 photoinduced carriers K1 UV radiation SP 576 OP 579 LK http://dx.doi.org/https://doi.org/10.1109/TCSET49122.2020.235498 DO https://doi.org/10.1109/TCSET49122.2020.235498 SF ELIB - SuUB Bremen
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