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Prediction of Visual Quality Metrics in Lossy Image Compres..:

, In: 2020 IEEE 40th International Conference on Electronics and Nanotechnology (ELNANO),
Krivenko, S. ; Li, F. ; Lukin, V... - p. 478-483 , 2020
Link: https://doi.org/10.1109/ELNANO50318.2020.9088819