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Influence of Stray Capacitance on Dynamic Test Results of P..:

, In: 2019 4th IEEE Workshop on the Electronic Grid (eGRID),
Tang, Xinling ; Zhang, Yu ; Sai, Zhaoyang... - p. 1-4 , 2019
Link: https://doi.org/10.1109/eGRID48402.2019.9092756