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Applicative System Level Test introduction to Increase Conf..:

, In: 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS),
Bernardi, P. ; Restifo, M. ; Reorda, M. Sonza... - p. 1-6 , 2020
Link: https://doi.org/10.1109/DDECS50862.2020.9095569