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Research on particle size identification method of residue ..:
, In:
2019 14th IEEE International Conference on Electronic Measurement & Instruments (ICEMI)
,
Kun, Chu
;
Yan, Lv
;
Yu, Gong
... - p. 917-922 , 2019
Link:
https://doi.org/10.1109/ICEMI46757.2019.9101579
RT T1 <cTitle>2019 14th IEEE International Conference on Electronic Measurement & Instruments (ICEMI)</cTitle>: T1 <Title>Research on particle size identification method of residue in sealed electronic devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9101579&Exemplar=1&LAN=DE A1 Kun, Chu A1 Yan, Lv A1 Yu, Gong A1 Guorong, Song A1 Zhichao, Ren A1 Cunfu, He YR 2019 K1 Feature extraction K1 Entropy K1 Neural networks K1 Interference K1 Working environment noise K1 Time-frequency analysis K1 Residue K1 Particle impact noise detection K1 Endpoint detection K1 Fisher's discriminant K1 BP neural network SP 917 OP 922 LK http://dx.doi.org/https://doi.org/10.1109/ICEMI46757.2019.9101579 DO https://doi.org/10.1109/ICEMI46757.2019.9101579 SF ELIB - SuUB Bremen
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