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1 Ergebnisse
1
Characterization of electromagnetic properties by simulatio..:
, In:
2019 14th IEEE International Conference on Electronic Measurement & Instruments (ICEMI)
,
Yungchun, Lee
;
Binpeng, Zhang
;
Yan, Lv
.. - p. 274-278 , 2019
Link:
https://doi.org/10.1109/ICEMI46757.2019.9101903
RT T1 <cTitle>2019 14th IEEE International Conference on Electronic Measurement & Instruments (ICEMI)</cTitle>: T1 <Title>Characterization of electromagnetic properties by simulations using the double-ridged cavity</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9101903&Exemplar=1&LAN=DE A1 Yungchun, Lee A1 Binpeng, Zhang A1 Yan, Lv A1 Guorong, Song A1 Cunfu, He YR 2019 K1 Cavity resonators K1 Permittivity measurement K1 Permittivity K1 Semiconductor device measurement K1 Permeability K1 Calibration K1 double-ridged cavity K1 electromagnetic properties K1 calibration method K1 shape factor SP 274 OP 278 LK http://dx.doi.org/https://doi.org/10.1109/ICEMI46757.2019.9101903 DO https://doi.org/10.1109/ICEMI46757.2019.9101903 SF ELIB - SuUB Bremen
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